Three-Dimensional X-Ray Diffraction Microscopy

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Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.


Up-to-date review Novel experimentation technology Includes supplementary material: sn.pub/extras

Inhalt
Introduction.- Methods for Meso-scale Structural Characterization.- Geometric Principles.- GRAINDEX and Related Analysis.- Orientation Mapping.- Combining 3DXRD and Absorption Contrast Tomography.- Multi-grain Crystallography.- The 3DXRD Microscope.- Applications.- Alternative Approaches.- Concluding Remarks.

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Weitere Informationen

  • Allgemeine Informationen
    • Sprache Englisch
    • Herausgeber Springer Berlin Heidelberg
    • Gewicht 271g
    • Untertitel Mapping Polycrystals and their Dynamics
    • Autor Henning Friis Poulsen
    • Titel Three-Dimensional X-Ray Diffraction Microscopy
    • Veröffentlichung 03.10.2013
    • ISBN 366214543X
    • Format Kartonierter Einband
    • EAN 9783662145432
    • Jahr 2013
    • Größe H235mm x B155mm x T10mm
    • Anzahl Seiten 172
    • Lesemotiv Verstehen
    • Auflage Softcover reprint of the original 1st edition 2004
    • GTIN 09783662145432

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