Three-Dimensional X-Ray Diffraction Microscopy
Details
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Up-to-date review Novel experimentation technology Includes supplementary material: sn.pub/extras
Inhalt
Introduction.- Methods for Meso-scale Structural Characterization.- Geometric Principles.- GRAINDEX and Related Analysis.- Orientation Mapping.- Combining 3DXRD and Absorption Contrast Tomography.- Multi-grain Crystallography.- The 3DXRD Microscope.- Applications.- Alternative Approaches.- Concluding Remarks.
Weitere Informationen
- Allgemeine Informationen
- Sprache Englisch
- Herausgeber Springer Berlin Heidelberg
- Gewicht 271g
- Untertitel Mapping Polycrystals and their Dynamics
- Autor Henning Friis Poulsen
- Titel Three-Dimensional X-Ray Diffraction Microscopy
- Veröffentlichung 03.10.2013
- ISBN 366214543X
- Format Kartonierter Einband
- EAN 9783662145432
- Jahr 2013
- Größe H235mm x B155mm x T10mm
- Anzahl Seiten 172
- Lesemotiv Verstehen
- Auflage Softcover reprint of the original 1st edition 2004
- GTIN 09783662145432