Advances in Non-volatile Memory and Storage Technology
Details
Informationen zum Autor Professor Yoshio Nishi is a Professor in the Department of Electrical Engineering and by courtesy in the Department of Material Science and Engineering. He was Director of the Stanford Nanofabrication Facility of National Nanotechnology Infrastructure Network and is now Director of Research of Stanford Center for Integrated Systems at Stanford University, USA Blanka Magyari-Köpe received her Ph.D. degree in physics from the Royal Institute of Technology, Stockholm, Sweden, in 2003. Since 2006, she has been an engineering Research Associate and from 2011 a Senior Research Engineer in the Department of Electrical Engineering at Stanford University. Prior to this position she was a postdoctoral researcher in the Department of Materials Science and Engineering, University of California, Los Angeles
Autorentext
Professor Yoshio Nishi is a Professor in the Department of Electrical Engineering and by courtesy in the Department of Material Science and Engineering. He was Director of the Stanford Nanofabrication Facility of National Nanotechnology Infrastructure Network and is now Director of Research of Stanford Center for Integrated Systems at Stanford University, USA Blanka Magyari-Köpe received her Ph.D. degree in physics from the Royal Institute of Technology, Stockholm, Sweden, in 2003. Since 2006, she has been an engineering Research Associate and from 2011 a Senior Research Engineer in the Department of Electrical Engineering at Stanford University. Prior to this position she was a postdoctoral researcher in the Department of Materials Science and Engineering, University of California, Los Angeles
Inhalt
Part 1: Progress in nonvolatile memory research and application
1. OxRAM technology development and performances
- Metal-oxide resistive random access memory (RRAM) technology: Material and operation details and ramifications
- Advanced modeling and characterization techniques for innovative memory devices: The RRAM case
- Mechanism of memristive switching in OxRAM
- Interface effects on memristive devices
- Spin-orbit torque magnetoresistive random-access memory (SOT-MRAM)
- Spin-transfer-torque magnetoresistive random-access memory (STT-MRAM) technology
- 3D-NAND Flash memory and technology
- Advances in oxide-based conductive bridge memory (CBRAM) technology for computing systems
Selector devices for x-point memory
Part 2: Emerging opportunities
- Ferroelectric memories
- Advances in nanowire PCM13. Flexible and transparent ReRAM devices for system on panel (SOP) application
- RRAM/memristor for computing
- Emerging memory technologies for neuromorphic hardware
- Neuromorphic computing with resistive switching memory devices
Weitere Informationen
- Allgemeine Informationen
- GTIN 09780081025840
- Genre Physics
- Auflage 2. A.
- Editor Nishi Yoshio, Blanka Magyari-Kope
- Anzahl Seiten 662
- Herausgeber Elsevier Science & Technology
- Größe H229mm x B152mm
- Jahr 2019
- EAN 9780081025840
- Format Kartonierter Einband
- ISBN 978-0-08-102584-0
- Veröffentlichung 18.06.2019
- Titel Advances in Non-volatile Memory and Storage Technology
- Autor Yoshio (Stanford University, Usa) Magyari-K Nishi
- Gewicht 1170g
- Sprache Englisch