Ion Time-of-Flight Spectrometer

Ion time-of-flight spectrometry techniques are
investigated for potential application to neutron
depth profiling. Time-of-flight techniques are used
extensively in a wide range of scientific and
technological applications including energy and mass
spectroscopy. Ion time-of-flight spectrometry offers
highly precise measurement capabilities, particularly
for slow particles. Time-of-flight spectrometry
involves correlated detection of two signals by a
coincidence unit. In ion time-of-flight spectroscopy,
the ion generates the primary input signal. The
secondary signal can be obtained by a number of ways.
In this work, the secondary signal is created by the
passage of the primary ion through a thin carbon
foil. Two ion time-of-flight spectrometer design
paradigms are introduced: the parallel electric and
magnetic (PEM) field spectrometer and the cross
electric and magnetic (CEM) field spectrometer.

Autorentext
Sacit Cetiner was born in Izmir, Turkey. He graduated from Hacettepe University, Nuclear Energy Engineering Department with a BS degree with distinction. He joined the Ph.D. program in Nuclear Engineering at the Pennsylvania State University, where he concurrently obtained an MS degree in Electrical Engineering.

Klappentext
Ion time-of-flight spectrometry techniques are investigated for potential application to neutron depth profiling. Time-of-flight techniques are used extensively in a wide range of scientific and technological applications including energy and mass spectroscopy. Ion time-of-flight spectrometry offers highly precise measurement capabilities, particularly for slow particles. Time-of-flight spectrometry involves correlated detection of two signals by a coincidence unit. In ion time-of-flight spectroscopy, the ion generates the primary input signal. The secondary signal can be obtained by a number of ways. In this work, the secondary signal is created by the passage of the primary ion through a thin carbon foil. Two ion time-of-flight spectrometer design paradigms are introduced: the parallel electric and magnetic (PEM) field spectrometer and the cross electric and magnetic (CEM) field spectrometer.