Reliability Physics and Engineering

This book provides critically important information for designing and building reliable cost-effective products. It includes numerous example problems with solutions.

"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.

Includes eight new appendices plus three new chapters on screening, heat generation and dissipation, and sampling plans and confidence intervals Provides fundamental reliability physics and engineering tools for building better products Contains statistical training and tools within the text Includes supplementary material: sn.pub/extras

Autorentext
Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.

Klappentext

Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.

Key features include:

· Materials/Device Degradation

· Degradation Kinetics

· Time-To-Failure Modeling

· Statistical Tools

· Failure-Rate Modeling

· Accelerated Testing

· Ramp-To-Failure Testing

· Important Failure Mechanisms for Integrated Circuits

· Important Failure Mechanisms for Mechanical Components

· Conversion of Dynamic Stresses into Static Equivalents

· Small Design Changes Producing Major Reliability Improvements

· Screening Methods

· Heat Generation and Dissipation

· Sampling Plans and Confidence Intervals

This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter.

Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists.

Inhalt
Introduction.- Materials and Device Degradation.- From Material/Device Degradation to Time-To-Failure.- Time-To-Failure Modeling.- Gaussian Statistics An Overview.- Time-To-Failure Statistics.- Failure Rate Modeling.- Accelerated Degradation.- Acceleration Factor Modeling.- Ramp-To-Failure Testing.- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB).- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering.- Conversion of Dynamical Stresses Into Effective Static Values.- Increasing the Reliability of Device/Product Designs.- Screening.- Heat Generation and Dissipation.- Sampling Plans and Confidence Intervals.- Appendix A: Useful Conversion Factors.- Appendix B: Useful Physical Constants.- Appendix C: Useful Rough Rules-Of-Thumb.- Appendix D: Useful Mathematical Expressions.- Appendix E: Useful Differentials and Definite Integrals.- Appendix F: Free-Energy.- Appendix G: t(1-/2,) Distribution Values.- Appendix H: 2(P,) Distribution Values.- Index.