Spectroscopic Ellipsometry for Photovoltaics

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Details

Presents ellipsometry characterization of solar cell materials/devices

Provides easy-to-understand explanations of ellipsometry data analysis

Includes optical constants for all solar-cell component layers

Presents ellipsometry characterization of solar cell materials/devices Provides easy-to-understand explanations of ellipsometry data analysis Includes optical constants for all solar-cell component layers

Autorentext

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University.

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.



Zusammenfassung
Presents ellipsometry characterization of solar cell materials/devices

Provides easy-to-understand explanations of ellipsometry data analysis

Includes optical constants for all solar-cell component layers

Inhalt

Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se2.- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization.- Cu2ZnSn(S,Se)4 and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783319753751
    • Lesemotiv Verstehen
    • Genre Electrical Engineering
    • Auflage 1st edition 2018
    • Editor Robert W. Collins, Hiroyuki Fujiwara
    • Sprache Englisch
    • Anzahl Seiten 616
    • Herausgeber Springer International Publishing
    • Größe H241mm x B160mm x T39mm
    • Jahr 2019
    • EAN 9783319753751
    • Format Fester Einband
    • ISBN 3319753754
    • Veröffentlichung 24.01.2019
    • Titel Spectroscopic Ellipsometry for Photovoltaics
    • Untertitel Volume 1: Fundamental Principles and Solar Cell Characterization
    • Gewicht 1080g

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