Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Autorentext
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Inhalt

1. Holography and Tomography with Electrons
   Axel Lubk
   2. Paraxial Quantum Mechanics
   Axel Lubk
   3. Tomography
   Axel Lubk
   4. Electron Optics in Phase Space
   Axel Lubk
   5. Electron Holography in Phase Space
   Axel Lubk
   6. Electron Holographic Tomography
   Axel Lubk
   7. Summary and Outlook
   Axel Lubk