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Advances in Imaging and Electron Physics: Volume 148
Details
Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Merges two serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features articles on the physics of electron devices! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! and! electron microscopy. Inhaltsverzeichnis On the Regularization of the Watershed Transform, by F. Meyer and C. VachierInterval and Fuzzy Analysis: A Unified Approach, by W. LodwickPlanar cold cathodes, by V.T Binh and V. Semet
Autorentext
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Klappentext
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Zusammenfassung
Merges two serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, and, electron microscopy.
Inhalt
On the Regularization of the Watershed Transform, by F. Meyer and C. VachierInterval and Fuzzy Analysis: A Unified Approach, by W. LodwickPlanar cold cathodes, by V.T Binh and V. Semet
Weitere Informationen
- Allgemeine Informationen
- GTIN 09780123739100
- Genre Mechanical Engineering
- Sprache Englisch
- Anzahl Seiten 264
- Herausgeber Elsevier Science & Technology
- Größe H229mm x B152mm
- Jahr 2007
- EAN 9780123739100
- Format Fester Einband
- ISBN 978-0-12-373910-0
- Veröffentlichung 06.09.2007
- Titel Advances in Imaging and Electron Physics: Volume 148
- Autor Peter W. Hawkes
- Gewicht 570g