Advances in Imaging and Electron Physics: Volume 167

Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext "Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy." This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians Zusammenfassung Features articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains. Inhaltsverzeichnis A History Of Cameca Emmanuel de Chambost Theory and Applications of General Adaptive Neighborhood Image Processing Johan Debayle, Jean-Charles Pinoli Shape Recognition Based on Eigenvalues of the Laplacian M. Ben Haj Rhouma, M.A. Khabou, L. Hermi Point Set Analysis Nicolas Lomenie, Georges Stamon Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals Leonid P. Yaroslavsky ...

Autorentext
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Klappentext

"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading international scholars and industry experts
• Discusses hot topic areas and presents current and future research trends

• Invaluable reference and guide for physicists, engineers and mathematicians

  Zusammenfassung
  Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  Inhalt

1. A History Of Cameca Emmanuel de Chambost

2. Theory and Applications of General Adaptive Neighborhood Image Processing Johan Debayle, Jean-Charles Pinoli

3. Shape Recognition Based on Eigenvalues of the Laplacian M. Ben Haj Rhouma, M.A. Khabou, L. Hermi

4. Point Set Analysis Nicolas Lomenie, Georges Stamon

5. Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals Leonid P. Yaroslavsky