Advances in Imaging and Electron Physics: Volume 168

Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Features articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains. Inhaltsverzeichnis The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach LucaGeretti, AntonioAbramo Logarithmic Image Processing for Color Images M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography Rainer A. Leitgeb Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy S.A. Nepijko, G. Schönhense Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Parish Aberration Correctors developed under Triple C Project Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga Spatially resolved thermoluminescence in a scanning electron microscope T. Schulz, M. Albrecht, K.Irmscher ...

Autorentext
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Klappentext

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zusammenfassung
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach LucaGeretti, AntonioAbramo

2. Logarithmic Image Processing for Color Images M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography Rainer A. Leitgeb

4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy S.A. Nepijko, G. Schönhense

5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging Chad M. Parish

6. Aberration Correctors developed under Triple C Project Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

7. Spatially resolved thermoluminescence in a scanning electron microscope T. Schulz, M. Albrecht, K.Irmscher