Advances in Imaging and Electron Physics: Volume 172

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Klappentext

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Zusammenfassung
Details the theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines.

Inhalt

1. Introduction to Neutron and X-ray Optics*Jay Theodore Cremer

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2. Compound Refractive Lenses and Prisms*Jay Theodore Cremer

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3. Geometric Neutron and X-ray Optics - Aberrations*Jay Theodore Cremer

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4. X-ray Optics*Jay Theodore Cremer

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5. Neutron Optics*Jay Theodore Cremer

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6. X-ray and Neutron Optics *Jay Theodore Cremer *