Advances in Imaging and Electron Physics: Volume 174

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Klappentext Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Features articles on the physics of electron devices! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in all these domains. This title provides information and updates on the developments in the field. Inhaltsverzeichnis Measurement Techniques and Practical Issues Jamal Deen Transmission lines and passive components Guennadi A. Kouzaev Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping Mohamed Bakr Field-effect types of transistors Benjamin Iniguez RF MEMS Switches and Switch Matrices Mojgan Daneshmand Substrate-Integrated Antennas on Silicon Natalia K. Nikolova

Zusammenfassung
Features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This title provides information and updates on the developments in the field.

Inhalt

  1. Measurement Techniques and Practical Issues Jamal Deen

  2. Transmission lines and passive components Guennadi A. Kouzaev

  3. Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping Mohamed Bakr

  4. Field-effect types of transistors Benjamin Iniguez

  5. RF MEMS Switches and Switch Matrices Mojgan Daneshmand

  6. Substrate-Integrated Antennas on Silicon Natalia K. Nikolova

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Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09780123942982
    • Genre Elektrotechnik
    • Auflage New.
    • Editor Deen Jamal
    • Orchester Jamal Deen
    • Sprache Englisch
    • Anzahl Seiten 470
    • Größe H229mm x B152mm
    • Jahr 2012
    • EAN 9780123942982
    • Format Fester Einband
    • ISBN 978-0-12-394298-2
    • Veröffentlichung 31.12.2012
    • Titel Advances in Imaging and Electron Physics: Volume 174
    • Autor Jamal (EDT) Deen
    • Untertitel Silicon-Based Millimetre-wave Technology
    • Gewicht 760g
    • Herausgeber ACADEMIC PR INC

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