Advances in Imaging and Electron Physics: Volume 175

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Autorentext
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Klappentext

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zusammenfassung
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

1. Small Angle Scatter with Correlation, Scatter and Intermediate Functions*Jay Theodore Cremer, Jr.

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2. Nuclear Scatter of Neutron Spin States*Jay Theodore Cremer, Jr.

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3. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope*Christian Dwyer

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4. Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka *and ****Maxime Carré

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5. Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy*Partha Pratim Mondal and Alberto Diaspro

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6. Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations *Stephen J. Sangwine *