Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. It Includes built-in testing techniques, linked to current industrial trends.

Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters Includes built-in testing techniques, linked to current industrial trends Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques Includes supplementary material: sn.pub/extras

Inhalt

Introduction.- Process Variation Challenges and Solutions Approaches.- High-Linearity Transconductance Amplifiers with Digital Correction Capability.- Multi-Bit Quantizer Design for Continuous-Time Sigma-Delta Modulators with Reduced Device Matching Requirements.- An On-Chip Temperature Sensor for the Measurement of RF Power Dissipation and Thermal Gradients.- Mismatch Reduction for Transitiors in High-Frequency Differential Analog Signal Paths.- Summary and Conclusions.