Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip

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Details

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

  • Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
  • Includes built-in testing techniques, linked to current industrial trends;
  • Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
  • Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

    Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters Includes built-in testing techniques, linked to current industrial trends Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques Includes supplementary material: sn.pub/extras

    Inhalt

Introduction.- Process Variation Challenges and Solutions Approaches.- High-Linearity Transconductance Amplifiers with Digital Correction Capability.- Multi-Bit Quantizer Design for Continuous-Time Sigma-Delta Modulators with Reduced Device Matching Requirements.- An On-Chip Temperature Sensor for the Measurement of RF Power Dissipation and Thermal Gradients.- Mismatch Reduction for Transitiors in High-Frequency Differential Analog Signal Paths.- Summary and Conclusions.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09781461422952
    • Genre Elektrotechnik
    • Auflage 2012
    • Sprache Englisch
    • Lesemotiv Verstehen
    • Anzahl Seiten 192
    • Größe H241mm x B160mm x T14mm
    • Jahr 2012
    • EAN 9781461422952
    • Format Fester Einband
    • ISBN 1461422957
    • Veröffentlichung 08.03.2012
    • Titel Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
    • Autor Jose Silva-Martinez , Marvin Onabajo
    • Gewicht 459g
    • Herausgeber Springer New York

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