Defect Detection via THz Imaging: Potentials and Limitations

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Details

Until recent years, terahertz waves were an
undiscovered, or most importantly, an unexploited
area of electromagnetic spectrum. Recent advances in
hardware have started to open up the eld to new
applications such as THz imaging. This non
destructive technology can penetrate through diverse
material such that the internal structure which is
invisible to other imaging modalities, can be
visualized. However, automated processing of THz
images can be quite challenging. Low contrast and the
presence of a widely unknown type of noise make the
analysis of these images difficult. Therefore,
pre-processing techniques are required for further
investigations.

Autorentext
Kaveh Houshmand was born in 1982. He moved to Canada with his family when he was 14 years old. After finishing his high school, he attended Queen's University for electrical engineering. He just finished his masters in systems design program specialized in image processing at University of Waterloo.

Klappentext
Until recent years, terahertz waves were an undiscovered, or most importantly, an unexploited area of electromagnetic spectrum. Recent advances in hardware have started to open up the eld to new applications such as THz imaging. This non destructive technology can penetrate through diverse material such that the internal structure which is invisible to other imaging modalities, can be visualized. However, automated processing of THz images can be quite challenging. Low contrast and the presence of a widely unknown type of noise make the analysis of these images difficult. Therefore, pre-processing techniques are required for further investigations.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783639103694
    • Genre Technik
    • Sprache Deutsch
    • Anzahl Seiten 88
    • Herausgeber VDM Verlag Dr. Müller e.K.
    • Größe H220mm x B150mm x T5mm
    • Jahr 2008
    • EAN 9783639103694
    • Format Kartonierter Einband (Kt)
    • ISBN 978-3-639-10369-4
    • Titel Defect Detection via THz Imaging: Potentials and Limitations
    • Autor Kaveh Houshmand
    • Untertitel A Brief History of THz Imaging
    • Gewicht 149g

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