Electronic Properties of Semiconductor Interfaces

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Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. Using the continuum of interfaceinduced gap states (IFIGS) as a unifying theme, Mönch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling's electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.


Basic standard book Important with respect to semiconductor structures Includes supplementary material: sn.pub/extras

Inhalt

  1. Introduction.- 2. Depletion Layer.- 3. Determination of Barrier Heights and Offsets.- 4. Laterally Inhomogeneous Schottky Contacts.- 5. The IFIGS-and-Electronegativity Theory.- 6. The MIGS-and-Electronegativity Concept: Experiment and Theory.- 7. First-Principles Calculations of Barrier Heights and Valence-Band Offsets.- 8. Temperature and Pressure Effects.- 9. Barrier Heights and Extrinsic Interface Defects.- 10. Extrinsic Interface Dipoles.- 11. Ohmic Contacts.- References.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783642057786
    • Auflage Softcover reprint of hardcover 1st edition 2004
    • Sprache Englisch
    • Genre Maschinenbau
    • Lesemotiv Verstehen
    • Anzahl Seiten 280
    • Größe H235mm x B155mm x T16mm
    • Jahr 2010
    • EAN 9783642057786
    • Format Kartonierter Einband
    • ISBN 3642057780
    • Veröffentlichung 01.12.2010
    • Titel Electronic Properties of Semiconductor Interfaces
    • Autor Winfried Mönch
    • Untertitel Springer Series in Surface Sciences 43
    • Gewicht 429g
    • Herausgeber Springer Berlin Heidelberg

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