Energy-Filtering Transmission Electron Microscopy

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Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.

Klappentext

BEnergy-Filtering Transmission Electron Microscopy /B(EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.


Zusammenfassung
"This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic." - Physicalia

Inhalt

  1. Introduction.- 2. Electron Optics of Imaging Energy Filters.- 3. Plasmons and Related Excitations.- 4. Inner-Shell Ionization.- 5. Quantitative Electron Energy-Loss Spectroscopy.- 6. Electron Spectroscopic Diffraction.- 7. Electron Spectroscopic Imaging.- 8. Energy-Filtered Reflection Electron Microscopy.

Weitere Informationen

  • Allgemeine Informationen
    • Sprache Englisch
    • Anzahl Seiten 440
    • Herausgeber Springer Berlin Heidelberg
    • Gewicht 663g
    • Untertitel Springer Series in Optical Sciences 71
    • Titel Energy-Filtering Transmission Electron Microscopy
    • Veröffentlichung 13.11.2013
    • ISBN 3662140551
    • Format Kartonierter Einband
    • EAN 9783662140550
    • Jahr 2013
    • Größe H235mm x B155mm x T24mm
    • Lesemotiv Verstehen
    • Beiträge von C. Deininger, R.F. Egerton, F. Hofer, B. Jouffrey, D. Krahl, R.D. Leapman, J. Mayer, Ludwig Reimer, H. Rose, P. Schattschneider, J.C.H. Spence
    • Schöpfer Ludwig Reimer, C. Deininger, R. F. Egerton, F. Hofer, B. Jouffrey, D. Krahl, R. D. Leapman, J. Mayer, H. Rose, P. Schattschneider, J. C. H. Spence
    • Editor Ludwig Reimer
    • Auflage Softcover reprint of the original 1st edition 1995
    • GTIN 09783662140550

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