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Ferroelectric Random Access Memories
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In fabrication of FeRAMs, various academic and technological backgrounds are necessary, which include ferroelectric materials, thin film formation, device physics, circuit design, and so on. This book covers from fundamentals to applications of ferroelectric random access memories (FeRAMs). The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well. Thus, this is a good introductory book on FeRAM for graduate students and newcomers to this field; it also helps specialists to understand FeRAMs more deeply.
Presents the state of the art of ferroelectric RAM design Application oriented reviews by leading experts Up-to-date references Includes supplementary material: sn.pub/extras
Inhalt
Part I Ferroelectric Thin Films: Overview.- Novel Si-substituted Ferroelectric Films.- Static and Dynamic Properties of Domains.- Nanoscale Phenomena in Ferroelectric Thin Films.- Part II Deposition and Characterization Methods: Sputtering Techniques.- Chemical Approach Using Tailored Liquid Sources to Bi-based Layer-structured Perovskite Thin Films.- Recent Development of Ferroelectric Thin Films by MOCVD.- Materials Integration Strategies.- Characterization by Scanning Nonlinear Dielectric Microscopy.- Part III Fabrication Process and Circuit Design: Current Status of FeRAMs.- Operation Principle and Circuit Design Issues.- High Density Integration.- Testing and Reliability.- Part IV Advanced-Type Memories: Chain FeRAMs.- Capacitor-on-Metal/Via-stacked-Plug (CMVP) Memory Cell and Application to a Non-volatile SRAM.- FET-type FeRAMs.- Part V Applications and Future Prospects: Application to Future Information Technology World.- Subject Index.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783642073847
- Auflage Softcover reprint of hardcover 1st edition 2004
- Editor Hiroshi Ishiwara, Yoshihiro Arimoto, Masanori Okuyama
- Sprache Englisch
- Genre Maschinenbau
- Lesemotiv Verstehen
- Anzahl Seiten 308
- Größe H234mm x B156mm x T17mm
- Jahr 2010
- EAN 9783642073847
- Format Kartonierter Einband
- ISBN 3642073840
- Veröffentlichung 03.12.2010
- Titel Ferroelectric Random Access Memories
- Untertitel Fundamentals and Applications
- Gewicht 471g
- Herausgeber Springer Berlin Heidelberg