Frontiers in Optical Methods

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This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

Gives a survey of advanced methods in current optical measurements Reviews the most up-to-date topics in an introductory way Numerous references to the original works help students and newcomers to enter the field Includes supplementary material: sn.pub/extras

Inhalt
State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.

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Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783642405938
    • Genre Elektrotechnik
    • Auflage 2014
    • Editor Ken-Ichi Shudo, Shin-Ya Ohno, Ikufumui Katayama
    • Sprache Englisch
    • Lesemotiv Verstehen
    • Anzahl Seiten 240
    • Größe H241mm x B160mm x T19mm
    • Jahr 2013
    • EAN 9783642405938
    • Format Fester Einband
    • ISBN 3642405932
    • Veröffentlichung 17.12.2013
    • Titel Frontiers in Optical Methods
    • Untertitel Nano-Characterization and Coherent Control
    • Gewicht 530g
    • Herausgeber Springer Berlin Heidelberg

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