Growth and Characterization of Ternary Chalcogenide Thin Films

Ternary thin films of Iron Copper Sulphide were grown using cheap and simple solution growth technique with EDTA, TEA and NH3 as complexing agents. The deposited films were characterized using PYE-UNICO-UV-2102 PC Spectrophotometer and Optical microscopy. The results suggest that the films have crystal structures. From the spectral analysis of absorbance/transmittance, the optical and solid state properties were determined. The optical properties considered revealed high absorbance and reflectance with low transmittance in the UV; low values of absorbance and reflectance accompanied with high transmittance in VIS-NIR regions, The absorption coefficient ranged from 0.1x106 to 1.65x106m-1. The real part of the refractive index ranged from 1.2 to 2.3. The corresponding values of optical conductivity ranged from 0.03x1014s-1 to 0.6x1014s-1. The extinction coefficient ranged from 0.005 to 0.038. The direct band gap ranged from 2.4eV to 2.8eV and the indirect band gap ranged from 0.6eV to 1.0eV. The real part of the dielectric constant ranged from 1.4 to 5.2 and the corresponding imaginary part ranged from 0.008 to 0.136.

Autorentext

Dr Chidi Chukwuemeka UHUEGBU holds a PhD degree in Solar Energy/Solid State Physics with research interest in thin film growth and renewable energy. He has several years experience of lecturing in University. Currently, he is a Senior Lecturer and Head of Department of Physics, Covenant University, Ota. Ogun State,Nigeria.