High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT) Describes a highly fault efficient SAT-based ATPG framework Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other Includes supplementary material: sn.pub/extras

Inhalt
Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.