Interconnect Noise Optimization in Nanometer Technologies

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This book provides insight into the use of CAD for layout analysis and optimization of interconnect in high speed, high complexity integrated circuits, which have become the dominating factor in determining system performance in nanometer technologies. The text investigates the effects on system performance and reliability of wire size, spacing, wire length, coupling length, load capacitance, rise time of the inputs, place of overlap, frequency, shields, signal direction and wire width for both the aggressors and the victim wires. The authors present a range of CAD algorithms and techniques for synthesizing and optimizing interconnect.


Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnect Provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits Includes supplementary material: sn.pub/extras

Inhalt
Noise Analysis and Design in Deep Submicron.- Interconnect Noise Analysis and Optimization Techniques.- Crosstalk Noise Analysis in Ultra Deep Submicrometer Technologies.- Minimum Area Shield Insertion for Inductive Noise Reduction.- Spacing Algorithms for Crosstalk Noise Reduction.- Post Layout Interconnect Optimization for Crosscoupling Noise Reduction.- 3D Integration.- EDA Industry Tools: State of the ART.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09781441938442
    • Genre Elektrotechnik
    • Auflage Softcover reprint of hardcover 1st edition 2006
    • Sprache Englisch
    • Lesemotiv Verstehen
    • Anzahl Seiten 160
    • Größe H235mm x B155mm x T9mm
    • Jahr 2010
    • EAN 9781441938442
    • Format Kartonierter Einband
    • ISBN 1441938443
    • Veröffentlichung 29.10.2010
    • Titel Interconnect Noise Optimization in Nanometer Technologies
    • Autor Magdy A. Bayoumi , Mohamed Elgamel
    • Gewicht 254g
    • Herausgeber Springer US

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