Interfacial Compatibility in Microelectronics

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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.


Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the traditional method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.

In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:

solutions to several common reliability issues in microsystem technology,

methods to understand and predict failure mechanisms at interfaces between dissimilar materials and

an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.

Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.


Inhalt

Introduction: Away from trial and error methods.- Materials and interfaces in Microsystems.- Introduction to mechanics of materials.- Introduction to thermodynamic-kinetic method.- Interfacial adhesion in polymer systems.- Evolution of different types of interfacial structures.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09781447160687
    • Auflage 2012
    • Sprache Englisch
    • Genre Allgemeines & Lexika
    • Lesemotiv Verstehen
    • Größe H235mm x B155mm x T13mm
    • Jahr 2014
    • EAN 9781447160687
    • Format Kartonierter Einband
    • ISBN 1447160681
    • Veröffentlichung 22.02.2014
    • Titel Interfacial Compatibility in Microelectronics
    • Autor Tomi Laurila , Vesa Vuorinen , Jorma Kivilahti , Markus Turunen , Toni T. Mattila , Mervi Paulasto-Kröckel
    • Untertitel Moving Away from the Trial and Error Approach
    • Gewicht 353g
    • Herausgeber Springer London
    • Anzahl Seiten 228

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