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Introduction to Quantum Metrology
Details
This book presents the theory of quantum effects used in metrology and results of the author's own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
Gives an introduction to quantum effects in metrology and quantum electronics Explains standards for quantum measurements Contains many applications and exercises for electrical quantities, mass, length, time and frequency Includes supplementary material: sn.pub/extras
Inhalt
Theoretical Background of Quantum Metrology.- Measures, Standards and Systems of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling and Possible Current Standard.- Atomic Clocks and Time Scales.- Interferometers and Measurements of Length.- Scanning Probe Microscopes.- Other Quantum Detectors.- Standards of the Kilogram Based on Fundamental Physical Constants.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783319384795
- Genre Technology Encyclopedias
- Auflage Softcover reprint of the original 1st edition 2015
- Lesemotiv Verstehen
- Anzahl Seiten 296
- Herausgeber Springer International Publishing
- Größe H235mm x B155mm x T17mm
- Jahr 2016
- EAN 9783319384795
- Format Kartonierter Einband
- ISBN 3319384791
- Veröffentlichung 09.10.2016
- Titel Introduction to Quantum Metrology
- Autor Waldemar Nawrocki
- Untertitel Quantum Standards and Instrumentation
- Gewicht 452g
- Sprache Englisch