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Kelvin Probe Force Microscopy
Details
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
First book dedicated soley to Kelvin force microscopy Explains basics, realization, modulation and data interpretation Provides important application examples Useful reference to researchers and graduate students alike Includes supplementary material: sn.pub/extras
Klappentext
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Inhalt
Introduction.- I. Technical Aspects.- Experimental technique and working modes.- Phase Modulation Kelvin Probe Microscopy.- Data interpretation, spatial resolution and deconvolution.- Contribution of the numerical approach to Kelvin probe force microscopies.- Quantum mechanical simulations of electrostatic tip-sample interactions.- II. Selected Applications.- Surface properties of III-V semiconductors.- Electronic surface properties of semiconductors devices.- Optoelectronic studies of solar cells.- Electrical characterization of low dimensional systems (quantum/nano-structures).- Electronic structure of molecular assemblies.- KPFM for biochemical analysis.- Local work function analysis of photo catalysts.- Kelvin probe force microscopy with atomic resolution.- Summary.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783642225659
- Auflage 2012
- Editor Thilo Glatzel, Sascha Sadewasser
- Sprache Englisch
- Genre Maschinenbau
- Lesemotiv Verstehen
- Anzahl Seiten 348
- Größe H241mm x B160mm x T25mm
- Jahr 2011
- EAN 9783642225659
- Format Fester Einband
- ISBN 3642225659
- Veröffentlichung 22.10.2011
- Titel Kelvin Probe Force Microscopy
- Untertitel Measuring and Compensating Electrostatic Forces
- Gewicht 688g
- Herausgeber Springer Berlin Heidelberg