Laser Deposition of Compound Semiconductors
Details
Laser deposition is a versatile technique for preparation of thin films. The process is modeled using both analytical and numerical techniques and described for semiconductors. A pulsed ruby laser was used to deposit CdTe, BN and AlN films. The book introduces the subject of laser materials processing and its applications. Thermal modeling is used to compute the temperature vs time and temperature vs depth profiles for CdTe and BN. CdTe and ZnCdTe crystals were grown by the Bridgman technique for these studies. Laser annealing for electrical activation of ion-implanted P in CdTe is compared favorably with thermal annealing. Another example is the use of the laser for formation of ohmic contacts of Au on CdTe. The main thrust of the work is on the deposition of CdTe, BN and AlN thin films which have been fully characterized using XRD,EDAX, XPS, optical absorption, PL and resistivity measurements which testify to their excellent quality. The variation of deposition rate with semiconductor bandgap is also studied. The book is intended for students and researchers in Semiconductor and Thin Film Technology.It should also be useful for researchers in Materials Science & Engineering.
Autorentext
Pijush Bhattacharya,M.Sc(Cal,Ph.D(IIT Kharagpur);Research Associate Professor,Fisk University,Nashville,USA.Field of interest:Laser deposition of thin filmsDwarka N. Bose,M.Sc(Tech)(Cal),Ph.D(Reading UK);Emeritus Scientist, former Professor and Dean,Indian Institute of Technology,Kharagpur,IndiaField of interest:Semiconductor Materials & Device
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783659124884
- Genre Technik
- Auflage Aufl.
- Sprache Englisch
- Anzahl Seiten 112
- Herausgeber LAP Lambert Academic Publishing
- Größe H220mm x B150mm x T7mm
- Jahr 2012
- EAN 9783659124884
- Format Kartonierter Einband (Kt)
- ISBN 978-3-659-12488-4
- Titel Laser Deposition of Compound Semiconductors
- Autor Pijush Bhattacharya , Dwarka Bose
- Untertitel Thermal modeling, Laser annealing, Film characterization and Experimental results
- Gewicht 185g