Laser Desorption Postionization Coupled to Time-Of-Flight MS

Surface phenomena and processes are becoming increasingly important in a wide variety of industrial applications, since materials properties are often controlled by the top atomic or molecular layers. However, many methods of organic surface analysis provide either insufficient or ambiguous data. Laser desorption postionization mass spectrometry offers greater control over the ionization process, providing abundant ion yields by ionizing the secondary neutrals. Postionization can be introduced by electron impact, radio frequency plasma or laser radiation. This book provides detailed descriptions of the instrumentation of laser desorption postionization coupled to a Time-of-Flight mass spectrometer. In addition, the laser system, timing schemes and instrument calibration are described. The instrument was successfully applied for the analysis of the model of dental composites, including glass fillers, silanes and resins, which crack and degrade in the oral cavity. This book should be useful to professionals in the field of Mass Spectrometry, or anyone who are interested in surface analysis using laser desorption ionization.

Autorentext

Chunping Wu, M.S.: Studied Laser Desorption Postionization Time- of-Flight MS at University of Illinois at Chicago. Ph.D. Student at Purdue University, West Lafayette.