Low Leakage SRAM Memory

I present some techniques to decrease the gate and other leakage dissipation in Deep Sub-Micron SRAM memories. This book reviews detail SRAM operations. This book also reviews various transistor intrinsic leakage mechanisms, including weak inversion, drain-induced barrier lowering, gate-induced drain leakage, and gate oxide tunneling. Finally, the book explores different circuit techniques to reduce the leakage power consumption. The W/L ratios are calculated from the equations of current in transistors (Linear and Saturation mode) for smooth read-write operation of both 0 and 1. I use W1/W3 = 1.5 and W4/W6 = 1.5. I first designed conventional SRAM memory and observed leakage current in various technology. In 90 nm technology conventional SRAM shows a leakage current of 1.87nA at steady state. Data retention gated-ground cache (DGR-cache) method reduces the leakage current to 100pA. Drowsy cache method reduces the leakage current to 84pA.

Autorentext

Debasis Mukherjee et Pankaj Kumar Sanda sont membres du corps enseignant du département d'ingénierie électronique et de communication de la Brainware University.