Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Informationen zum Autor Dr. Gerhard Hübschen worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, in the department for Materials characterization, defect detection and lifetime management? Dr. Iris Altpeter worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, and was the head of the department for Materials characterization, defect detection and lifetime management?. Dr. Ralf Tschuncky has been a member of the department for materials characterization at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany for more than 15 years. Prof. Hans-Georg Herrmann holds the chair of Lightweight Systems at Saarland University, Germany, and is also head of the department In-service Inspection & Life-cycle Monitoring? and deputy director at the Fraunhofer IZFP.

Autorentext
Dr. Gerhard Hübschen worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, in the department for Materials characterization, defect detection and lifetime management” Dr. Iris Altpeter worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, and was the head of the department for Materials characterization, defect detection and lifetime management”.Dr. Ralf Tschuncky has been a member of the department for materials characterization at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany for more than 15 years.Prof. Hans-Georg Herrmann holds the chair of Lightweight Systems at Saarland University, Germany, and is also head of the department In-service Inspection & Life-cycle Monitoring” and deputy director at the Fraunhofer IZFP.

Inhalt

1. Atomic force microscopy (AFM) for materials characterization
2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization
3. X-ray micro-tomography for materials characterization
4. X-ray diffraction (XRD) techniques for materials characterization
5. Microwave, millimeter wave and terahertz techniques for materials characterization
6. Acoustical microscopy for materials characterization
7. Ultrasonic techniques for materials characterization
8. Electromagnetic techniques for materials characterization
9. Hybrid methods for materials characterization