Microstructure Characterisation of Nano Chalcopyrites & Metal Carbide

It is well established that characterization of crystal structure, microstructure, crystallographic texture, flaw, defects, residual stress, mechanical properties, chemical composition and corrosion properties are utmost essential for materials used in various industrial applications. By controlling the defect related microstructural parameters like small particle size as well as lattice strains, dislocation densities and stacking faults, it is possible to obtain 'tailor made' materials with desired properties. Among various techniques, X-ray diffraction method is the most useful and non-destructive tool for material characterization, viz, crystal structure determination, quantitative estimation of different phases present in a polycrystalline material, microstructure characterization, measurement of residual stress and thereby mechanical properties and determination of orientation in polycrystalline aggregates. In research work, some nanocrystalline chalcopyrites and metal carbides have been prepared by high energy ball milling the elemental powder ingredients under inert atmosphere.

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