Modeling of AFM Cantilever

Atomic force microscopy (AFM) can be used for atomic and nanoscale surface characterization in both air and liquid environments. AFM is basically used to measure the mechanical, chemical and biological properties of the sample under investigation. AFM contains basically a base-excited microcantilever with nano tip along with a sensing circuit for scanning of images. Design and analysis of this microcantilevers is a challenging task in real time practice. In the present work, design and dynamic analysis of rectangular microcantilevers in tapping mode with tip-mass effect is considered. Computer simulations are performed with both lumped-parameter and distributed parameter models. The interatomic forces between the nano tip mass and substrate surfaces are treated using Lennard Jones (LJ) model and DMT model. The equations of motion are derived for both one-degree of freedom lumped parameter model with squeeze-film damping and distributed parameter model under the harmonic base excitation. Also the nonlinearity of the cantilever is investigated by considering cubic stiffness. The distributed parameter model is simplified with one mode approximation using Galerkin's scheme.

Autorentext

S. Manojkumar a obtenu son diplôme de Bachelor of Engineering de l'Université Shivaji en 2010. Il a obtenu une maîtrise en technologie à l'Institut national de technologie, Rourkela, Odhisa. Il travaille actuellement comme professeur adjoint à l'Université Shivaji. Il possède une expertise en analyse et simulation ANSYS et a consulté diverses agences d'ingénierie.