Wir verwenden Cookies und Analyse-Tools, um die Nutzerfreundlichkeit der Internet-Seite zu verbessern und für Marketingzwecke. Wenn Sie fortfahren, diese Seite zu verwenden, nehmen wir an, dass Sie damit einverstanden sind. Zur Datenschutzerklärung.
Optical properties of ZnTe thin films deposited using SILAR method
Details
This book starts with the theoretical back ground of optical absorption in semiconductors. Various optical parameters like the absorption (A), transmission(T), extinction coefficient (K), refractive index (n),optical energy gap (Eg), etc. were calculated with detailed analysis of UV-VIS-IR spectra for ZnTe thin films deposited by successive ionic layer absorption and reaction (SILAR) method at various thickness and annealing temperature.The results are analyzed and discussed in detail in this book.
Autorentext
Jignesh Rathod has done M.Sc. (Solid State Physics) and M.Phil (Thin film technology)from S.P.University. He has been pursuing doctorate degree in thin film technology under the guidance of Prof.V.M.Pathak. He has published many papers in renowned international journals, conferences & seminars. He has also worked as faculty in Engineering colleges.
Weitere Informationen
- Allgemeine Informationen
- Sprache Englisch
- Anzahl Seiten 64
- Herausgeber LAP LAMBERT Academic Publishing
- Gewicht 113g
- Autor Jignesh Rathod
- Titel Optical properties of ZnTe thin films deposited using SILAR method
- Veröffentlichung 11.03.2014
- ISBN 3659273856
- Format Kartonierter Einband
- EAN 9783659273858
- Jahr 2014
- Größe H220mm x B150mm x T4mm
- GTIN 09783659273858