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Process Variations and Probabilistic Integrated Circuit Design
Details
Based on qualitative and quantitative insight, this volume presents the technological, physical, and mathematical fundamentals for a design paradigm shift for microelectronic circuits. The text explores design flow variations to establish different variants while optimizing the overall design.
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design Describes critical effects of process variation using simple examples that can be reproduced by the reader
Autorentext
Dr. Manfred Dietrich leitet die Abteilung Mikroelektronische Systeme am Fraunhofer Institut, Institutsteil Entwurfsautomatisierung, in Dresden. Seit Jahren ist diese Abteilung in verschiedenen Industrie- und Förderprojekten auf dem Gebiet des 3D-Entwurfs integriert; sie arbeitet also aktiv an vorderster Stelle auf diesem neuen Arbeitsfeld mit.
Inhalt
Introduction.- Physical and Mathematical Fundamentals.- Examination of Process Parameter Variations.- Methods of Parameter Variations.- Consequences for Circuits Design and Case Studies.- Conclusion.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09781489988607
- Genre Elektrotechnik
- Auflage 2012
- Editor Joachim Haase, Manfred Dietrich
- Sprache Englisch
- Lesemotiv Verstehen
- Anzahl Seiten 268
- Größe H235mm x B155mm x T15mm
- Jahr 2014
- EAN 9781489988607
- Format Kartonierter Einband
- ISBN 1489988602
- Veröffentlichung 25.01.2014
- Titel Process Variations and Probabilistic Integrated Circuit Design
- Gewicht 411g
- Herausgeber Springer New York