Radiation Effects in Advanced Semiconductor Materials and Devices
Details
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Radiation defects in semiconductors have become an important factor as semiconductor device technologies include implantation. The knowledge presented here is also important for space applications. The book will appeal to researchers, engineers and advanced students.
Inhalt
Radiation Environments and Component Selection Strategy.- Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices.- Displacement Damage in Group IV Semiconductor Materials.- Radiation Damage in GaAs.- Space Radiation Aspects of Silicon Bipolar Technologies.- Radiation Damage in Silicon MOS Devices.- GaAs Based Field Effect Transistors for Radiation-Hard Applications.- Opto-Electronic Components for Space.- Advanced Semiconductor Materials and Devices - Outlook.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783642077784
- Auflage Softcover reprint of hardcover 1st edition 2002
- Sprache Englisch
- Genre Maschinenbau
- Lesemotiv Verstehen
- Anzahl Seiten 428
- Größe H235mm x B155mm x T24mm
- Jahr 2010
- EAN 9783642077784
- Format Kartonierter Einband
- ISBN 3642077781
- Veröffentlichung 01.12.2010
- Titel Radiation Effects in Advanced Semiconductor Materials and Devices
- Autor E. Simoen , C. Claeys
- Untertitel Springer Series in Materials Science 57
- Gewicht 645g
- Herausgeber Springer Berlin Heidelberg