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Regression Test Selection and Optimization for Embedded Programs
Details
In the recent past, there has been a rapid surge in the usage and reach of embedded applications. Embedded applications are now being used in different fields ranging from home appliances to even safety-critical areas such as health-care instruments, avionics, etc. Embedded systems used in safety-critical applications are required to have far greater reliability than conventional applications. Developing effective regression testing techniques for evolving embedded software is a problem of practical significance. Improved regression testing techniques will help to improve the quality of embedded software, and will also help reduce software maintenance costs. This book talks about improved regression testing techniques for embedded software. More specifically, we discuss regression test selection and optimization approaches suited for embedded software.
Autorentext
Swarnendu Biswas received his BE. and MS. degrees in Computer Science and Engineering from NIT Durgapur and IIT Kharagpur, India, respectively. He is currently pursuing his Phd. from the Ohio State University. His research interests include software testing, program analysis, real-time and embedded systems.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783847345787
- Sprache Englisch
- Auflage Aufl.
- Größe H7mm x B220mm x T150mm
- Jahr 2012
- EAN 9783847345787
- Format Kartonierter Einband (Kt)
- ISBN 978-3-8473-4578-7
- Titel Regression Test Selection and Optimization for Embedded Programs
- Autor Swarnendu Biswas
- Untertitel A Model-based Approach
- Gewicht 203g
- Herausgeber LAP Lambert Academic Publishing
- Anzahl Seiten 140
- Genre Informatik