Reliability, Availability and Serviceability of Networks-on-Chip

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Provides state-of-the-art research on the challenges to test, diagnose and tolerate faults in NoC-based systems Includes numerous, current test strategies, including re-use of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient re-use of the network, and power-aware and thermal-aware NoC-based SoC testing Offers a single source reference to the latest research, otherwise available only in disparate journals and conference proceedings Includes supplementary material: sn.pub/extras

Inhalt

Introduction.- NoC Basics.- Systems-on-Chip Testing.- NoC Reuse for SoC Modular Testing.- Advanced Approaches for NoC Reuse.- Test and Diagnosis of Routers.- Test and Diagnosis of Communication Channels.- Error Control Coding and Retransmission.- Error Location and Reconfiguration.- Concluding Remarks.