Reliability of Microtechnology
Details
This text discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. It covers many topics, and it addresses specific failure modes in solder and conductive adhesives at great length.
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.
The book also includes exercises and detailed solutions at the end of each chapter.
Discusses the general failure mechanisms of microsystems on a component level Comprehensive coverage of solder joint reliability at the microsystems level Includes accelerated testing of solder joints at the microsystems level Discusses quality issues and manufacturing at the microsystems level Includes supplementary material: sn.pub/extras
Inhalt
Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09781489982117
- Genre Elektrotechnik
- Auflage 2011
- Sprache Englisch
- Lesemotiv Verstehen
- Anzahl Seiten 220
- Größe H235mm x B155mm x T13mm
- Jahr 2014
- EAN 9781489982117
- Format Kartonierter Einband
- ISBN 1489982116
- Veröffentlichung 11.10.2014
- Titel Reliability of Microtechnology
- Autor Johan Liu , Olli Salmela , Cristina Andersson , James E. Morris , Per-Erik Tegehall , Jussi Sarkka
- Untertitel Interconnects, Devices and Systems
- Gewicht 341g
- Herausgeber Springer New York