Reliability Prediction by Accelerated Life Testing

Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. However, it is important to verify the reliability of a critical system before it is deployed. The three well-known methods for reliability prediction are empirical method, physics of failure and life testing. Accelerated life testing, on the other hand is an extension of life testing method where the units under test are subjected to elevated stress levels to induce early failures. The test depends on accelerating the dominant failure mechanisms which reduce the time of testing. The book focuses on reliability prediction of electronic modules by means of accelerated life testing. Step by step planning of the test is the highlight of this book.

Autorentext

Diana Denice is a Junior Scientist in Bhabha Atomic Research Centre, Mumbai. She completed her Bachelors in Electronics Engg. in 2009 and Masters with specialization in Nuclear technology in 2012. She has worked in the field of Design & Development of real-time computer based systems for Nuclear Power Plants and System reliability calculations.