Sample Preparation Handbook for Transmission Electron Microscopy

CHF 141.15
Auf Lager
SKU
EJ94PHGUA7P
Stock 1 Verfügbar
Geliefert zwischen Do., 15.01.2026 und Fr., 16.01.2026

Details

This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level) Includes supplementary material: sn.pub/extras

Klappentext

This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.

Key Features of the Handbook:

  • Combines all of the latest techniques for the preparation of mineral to biological samples

  • Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)

  • Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis

  • Links to a complementary interactive database website which is available to scientists worldwide*

  • Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/

    Inhalt
    Methodology: General Introduction.- to Materials.- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM).- Materials Problems and Approaches for TEM and TEM/STEM Analyses.- Physical and Chemical Mechanisms of Preparation Techniques.- Artifacts in Transmission Electron Microscopy.- Selection of Preparation Techniques Based on Material Problems and TEM Analyses.- Comparisons of Techniques.- Conclusion: What Is a Good Sample?.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09781489986979
    • Auflage 2010
    • Sprache Englisch
    • Genre Maschinenbau
    • Lesemotiv Verstehen
    • Anzahl Seiten 276
    • Größe H235mm x B155mm x T16mm
    • Jahr 2014
    • EAN 9781489986979
    • Format Kartonierter Einband
    • ISBN 1489986979
    • Veröffentlichung 01.09.2014
    • Titel Sample Preparation Handbook for Transmission Electron Microscopy
    • Autor Jeanne Ayache , Luc Beaunier , Danièle Laub , Gabrielle Ehret , Jacqueline Boumendil
    • Untertitel Methodology
    • Gewicht 423g
    • Herausgeber Springer New York

Bewertungen

Schreiben Sie eine Bewertung
Nur registrierte Benutzer können Bewertungen schreiben. Bitte loggen Sie sich ein oder erstellen Sie ein Konto.
Made with ♥ in Switzerland | ©2025 Avento by Gametime AG
Gametime AG | Hohlstrasse 216 | 8004 Zürich | Schweiz | UID: CHE-112.967.470