Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Summarizes the currrent state of the art in scanning probe microscoopy techniques Contains strong part on biological applications Contributions by leading researchers and application scientists from all over the world and from various industries provide a broader perspective Includes supplementary material: sn.pub/extras

Autorentext
Bharat Bhushan is Ohio Eminent Scholar and The Howard D. Winbigler Professor at the College of Engineering, and Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at Ohio State University, Columbus, OH. He authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. Bharat Bhusan received numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He worked for various research labs including IBM Almaden Research Center, San Jose, CA.

Inhalt
Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging.- New developments in imaging of biological samples.- New developments in AFM.- SNOM.- Part 2: Nanocharacterization.- Antibodies for protein recognition.- In-situ imaging of living cells.- In-situ crystallization of wax materials.- Part 3: Biomimetics and industrial applications.- Electrowetting and switchable hydrophobicity.- Renewable energy applications.- AFMs in hard disk industry.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783642254130
    • Genre Elektrotechnik
    • Auflage 2012
    • Editor Bharat Bhushan
    • Sprache Englisch
    • Lesemotiv Verstehen
    • Anzahl Seiten 652
    • Größe H241mm x B160mm x T40mm
    • Jahr 2012
    • EAN 9783642254130
    • Format Fester Einband
    • ISBN 3642254136
    • Veröffentlichung 16.10.2012
    • Titel Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
    • Untertitel NanoScience and Technology
    • Gewicht 1133g
    • Herausgeber Springer Berlin Heidelberg

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