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Silicon-Germanium (SiGe) Nanostructures
Details
Nanostructured silicon-germanium (SiGe) opens up the prospects of novel and enhanced electronic device performance, especially for semiconductor devices. Silicon-germanium (SiGe) nanostructures reviews the materials science of nanostructures and their properties and applications in different electronic devices.The introductory part one covers the structural properties of SiGe nanostructures, with a further chapter discussing electronic band structures of SiGe alloys. Part two concentrates on the formation of SiGe nanostructures, with chapters on different methods of crystal growth such as molecular beam epitaxy and chemical vapour deposition. This part also includes chapters covering strain engineering and modelling. Part three covers the material properties of SiGe nanostructures, including chapters on such topics as strain-induced defects, transport properties and microcavities and quantum cascade laser structures. In Part four, devices utilising SiGe alloys are discussed. Chapters cover ultra large scale integrated applications, MOSFETs and the use of SiGe in different types of transistors and optical devices.With its distinguished editors and team of international contributors, Silicon-germanium (SiGe) nanostructures is a standard reference for researchers focusing on semiconductor devices and materials in industry and academia, particularly those interested in nanostructures.
Autorentext
Yasuhiro Shiraki is a Professor at Tokyo City University Advanced Research Laboratories, Japan. Noritaka Usami is a Professor at the Graduate School of Engineering, Nagoya University, Japan.
Inhalt
Contributor contact details
Preface
Part I: Introduction
Chapter 1: Structural properties of silicon-germanium (SiGe) nanostructures
Abstract:
1.1 Introduction
1.2 Crystal structure
1.3 Lattice parameters
1.4 Phase diagram
1.5 Critical thickness
1.6 Structural characterization by X-ray diffraction
1.7 Future trends
1.8 Acknowledgement
Chapter 2: Electronic band structures of silicon-germanium (SiGe) alloys
Abstract:
2.1 Band structures
2.2 Strain effects
2.3 Effective mass
2.4 Conclusion
Part II: Formation of nanostructures
Chapter 3: Understanding crystal growth mechanisms in silicon-germanium (SiGe) nanostructures
Abstract:
3.1 Introduction
3.2 Thermodynamics of crystal growth
3.3 Fundamental growth processes
3.4 Kinetics of epitaxial growth
3.5 Heteroepitaxy
Chapter 4: Types of silicon-germanium (SiGe) bulk crystal growth methods and their applications
Abstract:
4.1 Introduction
4.2 Growth methods
4.3 Application of silicon-germanium (SiGe) bulk crystal to heteroepitaxy
4.4 Conclusion
Chapter 5: Silicon-germanium (SiGe) crystal growth using molecular beam epitaxy
Abstract:
5.1 Introduction
5.2 Techniques
5.3 Nanostructure formation by molecular bean epitaxy (MBE)
5.4 Future trends
Chapter 6: Silicon-germanium (SiGe) crystal growth using chemical vapor deposition
Abstract:
6.1 Introduction
6.2 Epitaxial growth techniques - chemical vapor deposition (CVD) (ultra high vacuum CVD (UHVCVD), low pressure CVD (LPCVD), atmospheric pressure CVD (APCVD), plasma enhanced CVD (PECVD))
6.3 Silicon-germanium (SiGe) heteroepitaxy by chemical vapor deposition (CVD)
6.4 Doping of silicon-germanium (SiGe)
6.5 Conclusion and future trends
Chapter 7: Strain engineering of silicon-germanium (SiGe) virtual substrates
Abstract:
7.1 Introduction
7.2 Compositionally graded buffer
7.3 Low-temperature buffer
7.4 Ion-implantation buffer
7.5 Other methods and future trends
Chapter 8: Formation of silicon-germanium on insulator (SGOI) substrates
Abstract:
8.1 Introduction: demand for virtual substrate and (Si)Ge on insulator (SGOI)
8.2 Formation of (Si)Ge on insulator (SGOI) by the Ge condensation method
8.3 Extension toward Ge on insulator
8.4 Conclusion
8.5 Acknowledgment
Chapter 9: Miscellaneous methods and materials for silicon-germanium (SiGe) based heterostructures
Abstract:
9.1 Introduction
9.2 Oriented growth of silicon-germanium (SiGe)on insulating films for thin film transistors and 3-D stacked devices
9.3 Heteroepitaxial growth of ferromagnetic Heusler alloys for silicon-germanium (SiGe)-based spintronic devices
9.4 Conclusion
Chapter 10: Modeling the evolution of germanium islands on silicon(001) thin films
Abstract:
10.1 A few considerations on epitaxial growth modeling
10.2 Introduction to Stranski-Krastanow (SK) heteroepitaxy
10.3 Onset of Stranski-Krastanow (SK) heteroepitaxy
10.4 Beyond the Stranski-Krastranow (SK) onset: SiGe intermixing
10.5 Beyond the Stranski-Krastanow (SK) onset: vertical and horizontal ordering for applications
10.6 Future trends: ordering Ge islands on pit-patterned Si(001)
Chapter 11: Strain engineering of silicon-germanium (SiGe) micro- and nanostructures
Abstract:
11.1 Introduction
11.2 Growth insights
11.3 Island engineering
11.4 Rolled-up nanotechnology
11.5 Potential applications
11.6 Sources of further information and advice
11.7 Acknowledgments
Part III: Material properties of SiGe nanostructures
Chapter 12: Self-diffusion an
Weitere Informationen
- Allgemeine Informationen
- Sprache Englisch
- Anzahl Seiten 656
- Herausgeber Elsevier Science & Technology
- Gewicht 1089g
- Untertitel Production, Properties and Applications in Electronics
- Autor Y. (Japan) Usami, N (Tohoku University, J Shiraki
- Titel Silicon-Germanium (SiGe) Nanostructures
- ISBN 978-0-08-101739-5
- Format Kartonierter Einband
- EAN 9780081017395
- Jahr 2016
- Größe H30mm x B156mm x T234mm
- Editor Yasuhiro Shiraki, Noritaka Usami
- GTIN 09780081017395