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Software Defect and Operational Profile Modeling
Details
also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
Klappentext
also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
Zusammenfassung
`This well-crafted summary of research and engineering in software defect estimation and operational profile modeling is a useful addition to the software reliability engineering literature.'
Computing Reviews (June 1999)
Inhalt
1 Introduction.- 1.1 Software Engineering.- 1.2 Software Reliability Engineering.- 1.3 Software Defect Estimations.- 1.4 Summary.- 1.5 Remarks and Problems.- References.- 2 Empirical Regression Methods.- 2.1 Software Defect Factors and Distributions.- 2.2 Software Defect Distributions by Rank.- 2.3 Linear Regression Models.- 2.4 Haistead Model.- 2.5 Miscellaneous.- 2.6 Summary.- 2.7 Remarks and Problems.- References.- 3 Dynamic Methods.- 3.1 Jelinski-Moranda Model and the Like.- 3.2 NHPP Models.- 3.3 Use of Discrete-Time Data.- 3.4 Notes on Time Bases.- 3.5 Summary.- 3.6 Remarks and Problems.- References.- 4 Capture-Recapture Methods.- 4.1 Software Defect Seeding.- 4.2 Basic Models.- 4.3 BasinModels.- 4.4 AUrnModel.- 4.5 Summary.- 4.6 Remarks and Problems.- References.- 5 Decomposition Methods.- 5.1 Model Formulation.- 5.2 Case Study.- 5.3 Summary.- 5.4 Remarks and Problems.- References.- 6 Neural Network Methods.- 6.1 Neural Networks.- 6.2 Software Defect Predictions.- 6.3 Summary.- 6.4 Remarks and Problems.- References.- 7 Software Defect Estimations Under Imperfect Debugging.- 7.1 Imperfect Debugging.- 7.2 Goel-Okumoto 1DM Model.- 7.3 Goel-Okumoto NHPP Model under Imperfect Debugging.- 7.4 Death-Birth Model.- 7.5 Phase-Directed Models.- 7.6 Software Failure Behavior versus Software Defect Behavior.- 7.7 A Static Model.- 7.8 Summary.- 7.9 Remarks and Problems.- References.- 8 Software Operational Profile Modeling.- 8.1 Software Operational Profiles.- 8.2 Model I.- 8.3 Model II.- 8.4 Model III.- 8.5 Model IV.- 8.6 ModelV.- 8.7 Summary.- 8.8 Remarks and Problems.- References.- 9 Modeling of Probably Zero-Defect Software.- 9.1 Probability of Being Failure-Free versus Probability of Being Defect-Free.- 9.2 Classic Interval Estimations.- 9.3 Bayesian Point Estimations.- 9.4 Incorporating Software Operational Profile.- 9.5 Quantifying Software Correctness.- 9.6 Summary.- 9.7 Remarks and Problems.- References.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09781461375593
- Sprache Englisch
- Größe H235mm x B155mm x T16mm
- Jahr 2012
- EAN 9781461375593
- Format Kartonierter Einband
- ISBN 1461375592
- Veröffentlichung 12.10.2012
- Titel Software Defect and Operational Profile Modeling
- Autor Kai-Yuan Cai
- Untertitel International Series in Software Engineering 4
- Gewicht 446g
- Herausgeber Springer
- Anzahl Seiten 292
- Lesemotiv Verstehen
- Genre Informatik