Software Failure Investigation

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Details

Investigates software failures in an operational environment through near-miss analysis;
Studies recent and major software failures of significant magnitude;
Provides a design of an architecture for a Near-Miss Management System



Autorentext
Professor Jan Eloff graduated in 1985 with a PhD in Computer Science. Up to June 2015 he was appointed as the Research Director for SAP Research in Africa and is currently appointed as Deputy Dean Research & Postgraduate studies: Faculty of Eng., Built Environment and IT (EBIT) and as a full professor in computer science at the University of Pretoria. From 2007 he is an associate-editor of the Computers & Security journal and an editorial member for the international Computer Fraud & Security bulletin published by Elsevier. He is an internationally recognised researcher and has published 113 peer reviewed papers with 3537 citations.
Dr. Madeleine Bihina Bella has over 10 years of industry experience with expertise in IT security and business analysis working in leading roles in a number of multinationals across various industries. She is also a part-time computer science lecturer. In 2015 she graduated with a PhD in Computer Science from the University of Pretoria specializing in the field of digital forensics. Her research focused on near-miss analysis as a novel technique to improve the forensic investigation of software failures. . She received a number of awards for her doctoral research including the South African Women in Science Award, the Google Women Techmakers sholarship and the L'Oréal/UNESCO Regional Fellowship for Women in Science in Sub-Saharan Africa. She has published a number of journal and conference papers.

Inhalt
Chap1: Introduction.- Chap2: Software Failures: An Overview.- Chap3: Near-Miss Analysis: An Overview.- Chap4: A Methodology for Investigating Software Failures Using Digital Forensics and Near-Miss Analysis.- Chap5: A Well-Defined Model for Near-Miss Detection And Prioritisation.- Chap6: An Architecture for a Near-Miss System (Nms).- Chap7: Practical Demonstration of Conducting a Near-Miss Analysis Investigation for Software Failures.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783319870540
    • Genre Elektrotechnik
    • Auflage Softcover reprint of the original 1st edition 2018
    • Sprache Englisch
    • Lesemotiv Verstehen
    • Anzahl Seiten 132
    • Größe H235mm x B155mm x T8mm
    • Jahr 2018
    • EAN 9783319870540
    • Format Kartonierter Einband
    • ISBN 3319870548
    • Veröffentlichung 18.08.2018
    • Titel Software Failure Investigation
    • Autor Madeleine Bihina Bella , Jan Eloff
    • Untertitel A Near-Miss Analysis Approach
    • Gewicht 213g
    • Herausgeber Springer International Publishing

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