Solid State Lighting Reliability Part 2

In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and findings in the LED system reliability arena. Topics in this book cover the early failures and critical steps in LED manufacturing; advances in reliability testing and standards; quality of colour and colour stability; degradation of optical materials and the associated chromaticity maintenance; characterization of thermal interfaces; LED solder joint testing and prediction; common failure modes in LED drivers; root causes for lumen depreciation; corrosion sensitivity of LED packages; reliability management for automotive LEDs, and lightning effects on LEDs. This book is a continuation of Solid State Lighting Reliability: Components to Systems (published in 2013), which covers reliability aspects ranging from the LED to the total luminaire or system of luminaires. Together, these two books are a full set of reference books for Solid State Lighting reliability from the performance of the (sub-) components to the total system, regardless its complexity.

Covers new developments on the pressing issues of color stability and the prognostics of chromaticity, and describes the new guidelines for LED systems, in particular the interactions with LED sources; Analyzes the advances in the accelerated test method and lifetime prediction method; Is one of the few books on the market that covers Solid State Lighting applications. Includes supplementary material: sn.pub/extras

Autorentext
Willem Dirk van Driel is the Solid State Lightning Reliability Program Manager for Philips Lighting Eindhoven, and is Assistant Professor of Micro/Nano Reliability at Delft University of Technology, in the Electronic Components, Technology and Materials Department.

Xuejun Fan is Professor in the Department of Mechanical Engineering at Lamar University.

G.Q. Zhang is Professor of Micro/Nanoelectronics, System Integration and Reliability (MSI&R) at the Delft University of Technology.

Inhalt
Introduction.- Degradation of Epitaxial Layers in LEDs.- Advances in Reliability Testing and Standards Development for LED Packages and System.- Lifetime Assessment of Optical Materials in LED-based Products.- Characterization of Die-Attach Thermal Interface of High Power Light Emitting Diodes: An Optical/Electrical/Thermal Inverse Approach.- LED-based Luminaire Color Shift Acceleration and Prediction.- Fault Diagnostics and Lifetime Prognostics for Phosphor-Converted White LED Packages.- Online Testing Method and System of LED Reliability and their Applications.- Degradation Mechanisms of Mid-Power White-Light LEDs.- Driver Reliability: Failure Modes.- Driver Reliability: A Physics of Failure Approach for Driver Reliability Prediction.- Reliability of Connectors.- Reliability of Complex Systems, Including Software.