Testing of ASIC and FPGA circuits
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VNEL3VJOSK0
Geliefert zwischen Do., 06.11.2025 und Fr., 07.11.2025
Details
This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.
Autorentext
I have done B.Tech in electornics and MS by research in VLSI testing from IIIT Hyderabad, India.Currently I am working for nVIDIA graphics as hardware engg in dft team.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783659275852
- Anzahl Seiten 160
- Genre Wärme- und Energietechnik
- Herausgeber LAP Lambert Academic Publishing
- Größe H220mm x B220mm x T150mm
- Jahr 2012
- EAN 9783659275852
- Format Kartonierter Einband (Kt)
- ISBN 978-3-659-27585-2
- Titel Testing of ASIC and FPGA circuits
- Autor Sumit Raj
- Untertitel VLSI testing and verification
- Sprache Englisch
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