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Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Details
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Focuses on the thermal reliability of power semiconductor device in the renewable energy system Offers abundant experimental tests to explain the device thermal reliability improvement techniques Discusses the development trend and future expectations of power semiconductor device thermal reliability
Autorentext
Xiong Du obtained his B.S., M.S., and Ph. D. degrees from Chongqing University, China in 2000, 2002, and 2005 respectively, all in the Electrical Engineering. He has been with Chongqing University since 2002 and is currently a full professor in the School of Electrical Engineering, Chongqing University. He was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY from July 2007 to July 2008. His research interests include power electronics system reliability and stability. He is a recipient of the National Excellent Doctoral Dissertation of P.R. China in 2008. Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.
Inhalt
Introduction.- Thermal fatigue failure mechanism of power devices in renewable energy system.- Thermal model and thermal parameters monitoring.- Thermal analysis of power semiconductor device in renewable energy system.- Multi-time scale lifetime evaluation for the device in the renewable application.- Thermal management design and optimization.- Prospect.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09789811931314
- Lesemotiv Verstehen
- Genre Electrical Engineering
- Auflage 1st edition 2022
- Sprache Englisch
- Anzahl Seiten 188
- Herausgeber Springer Nature Singapore
- Größe H241mm x B160mm x T16mm
- Jahr 2022
- EAN 9789811931314
- Format Fester Einband
- ISBN 9811931313
- Veröffentlichung 09.07.2022
- Titel Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
- Autor Xiong Du , Jun Zhang , Rui Du , Yaoyi Yu , Cheng Qian , Gaoxian Li
- Untertitel CPSS Power Electronics Series
- Gewicht 488g