Wir verwenden Cookies und Analyse-Tools, um die Nutzerfreundlichkeit der Internet-Seite zu verbessern und für Marketingzwecke. Wenn Sie fortfahren, diese Seite zu verwenden, nehmen wir an, dass Sie damit einverstanden sind. Zur Datenschutzerklärung.
Trace-Based Post-Silicon Validation for VLSI Circuits
Details
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Provides a comprehensive summary of state-of-the-art on post-silicon validation Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer Illustrate key concepts and algorithms with real examples Includes supplementary material: sn.pub/extras
Inhalt
Introduction.- State of the Art on Post-Silicon Validation.- Signal Selection for Visibility Enhancement.- Multiplexed Tracing for Design Error.- Tracing for Electrical Error.- Reusing Test Access Mechanisms.- Interconnection Fabric for Flexible Tracing.- Interconnection Fabric for Systematic Tracing.- Conclusion.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783319005324
- Genre Elektrotechnik
- Auflage 2013
- Sprache Englisch
- Lesemotiv Verstehen
- Anzahl Seiten 124
- Größe H241mm x B160mm x T11mm
- Jahr 2013
- EAN 9783319005324
- Format Fester Einband
- ISBN 3319005324
- Veröffentlichung 27.06.2013
- Titel Trace-Based Post-Silicon Validation for VLSI Circuits
- Autor Qiang Xu , Xiao Liu
- Untertitel Lecture Notes in Electrical Engineering 252
- Gewicht 360g
- Herausgeber Springer International Publishing