Wafer Testing
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Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them. The wafer testing is performed by a piece of test equipment called a wafer prober. The process of wafer testing can be referred to in several ways: Wafer Sort (WS), Wafer Final Test (WFT), Electronic Die Sort (EDS) and Circuit Probe (CP) are probably the most common.
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GarantieWeitere Informationen
- Allgemeine Informationen
- GTIN 09786130993177
- Anzahl Seiten 72
- Genre Wärme- und Energietechnik
- Editor Lambert M. Surhone, Miriam T. Timpledon, Susan F. Marseken
- Herausgeber Betascript Publishing
- Größe H220mm x B220mm
- EAN 9786130993177
- Format Fachbuch
- Titel Wafer Testing
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