X-Ray Diffraction Crystallography

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X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Tutorial-like scientific monograph on X-ray diffraction analysis Summarizes the complete knowledge on X-Ray diffraction crystallography and structure analysis of crystals for researchers and graduate students Presents the crystallographic basics in a systematic way and fundamental properties of X-rays Excellent book for newcomers with 90 exercises and solutions + 90 problems Includes supplementary material: sn.pub/extras Request lecturer material: sn.pub/lecturer-material

Inhalt
Fundamental Properties of X-rays.- Geometry of Crystals.- Scattering and Diffraction by Atoms and Crystals.- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures.- Reciprocal Lattice and Integrated Intensity from Crystals.- Symmetry Analysis for Crystals and the Use of International Tables.- Solved Problems.

Weitere Informationen

  • Allgemeine Informationen
    • GTIN 09783642442551
    • Auflage 2011
    • Sprache Englisch
    • Genre Maschinenbau
    • Lesemotiv Verstehen
    • Anzahl Seiten 324
    • Größe H235mm x B155mm x T18mm
    • Jahr 2014
    • EAN 9783642442551
    • Format Kartonierter Einband
    • ISBN 3642442552
    • Veröffentlichung 21.11.2014
    • Titel X-Ray Diffraction Crystallography
    • Autor Yoshio Waseda , Kozo Shinoda , Eiichiro Matsubara
    • Untertitel Introduction, Examples and Solved Problems
    • Gewicht 493g
    • Herausgeber Springer Berlin Heidelberg

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