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X-Ray Multiple-Wave Diffraction
Details
X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two or higher-dimensional structures, like 2-d and 3-d crystals and even quasi crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.
Provides an overview of advanced methods in x-ray diffraction from materials Suitable as advanced textbook
Klappentext
This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.
Inhalt
- Introduction.- 2. Elements of X-Ray Physics and Crystallography.- 3. Diffraction Geometry.- 4. Experimental Techniques.- 5. Kinematical Theory of X-Ray Diffraction.- 6. Dynamical Theory of X-Ray Diffraction.- 7. Theoretical Approaches.- 8. Dynamical Diffraction Properties and Behaviors.- 9. Applications.- References.- Figure Acknowledgements.
Weitere Informationen
- Allgemeine Informationen
- GTIN 09783642059476
- Auflage Softcover reprint of hardcover 1st edition 2004
- Sprache Englisch
- Genre Maschinenbau
- Lesemotiv Verstehen
- Anzahl Seiten 452
- Größe H235mm x B155mm x T25mm
- Jahr 2010
- EAN 9783642059476
- Format Kartonierter Einband
- ISBN 3642059473
- Veröffentlichung 05.12.2010
- Titel X-Ray Multiple-Wave Diffraction
- Autor Shih-Lin Chang
- Untertitel Theory and Application
- Gewicht 680g
- Herausgeber Springer Berlin Heidelberg